BibTeX record conf/latw/ShahMKFS17

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@inproceedings{DBLP:conf/latw/ShahMKFS17,
  author       = {Toral Shah and
                  Anzhela Yu. Matrosova and
                  Binod Kumar and
                  Masahiro Fujita and
                  Virendra Singh},
  title        = {Testing multiple stuck-at faults of {ROBDD} based combinational circuit
                  design},
  booktitle    = {18th {IEEE} Latin American Test Symposium, {LATS} 2017, Bogot{\'{a}},
                  Colombia, March 13-15, 2017},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/LATW.2017.7906753},
  doi          = {10.1109/LATW.2017.7906753},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/ShahMKFS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}