BibTeX record conf/latw/SandovalBZKRM21

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@inproceedings{DBLP:conf/latw/SandovalBZKRM21,
  author       = {Bernardo Borges Sandoval and
                  Leonardo Heitich Brendler and
                  Alexandra L. Zimpeck and
                  Fernanda Lima Kastensmidt and
                  Ricardo Reis and
                  Cristina Meinhardt},
  title        = {Exploring Gate Mapping and Transistor Sizing to Improve Radiation
                  Robustness: {A} {C17} Benchmark Case-study},
  booktitle    = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
                  Este, Uruguay, October 27-29, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/LATS53581.2021.9651798},
  doi          = {10.1109/LATS53581.2021.9651798},
  timestamp    = {Sat, 30 Sep 2023 09:52:04 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SandovalBZKRM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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