BibTeX record conf/latw/PerezMVVC20

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@inproceedings{DBLP:conf/latw/PerezMVVC20,
  author       = {Zahira Perez and
                  Javier Mesalles and
                  Hector Villacorta and
                  Fabian Vargas and
                  V{\'{\i}}ctor H. Champac},
  title        = {Analysis and detection of hard-to-detect full open defects in FinFET
                  based {SRAM} cells},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093680},
  doi          = {10.1109/LATS49555.2020.9093680},
  timestamp    = {Fri, 03 Sep 2021 09:01:39 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PerezMVVC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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