BibTeX record conf/latw/MarquesMB20

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@inproceedings{DBLP:conf/latw/MarquesMB20,
  author       = {Cleiton Magano Marques and
                  Cristina Meinhardt and
                  Paulo F. Butzen},
  title        = {Soft Error Reliability of {SRAM} cells during the three operation
                  states},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093684},
  doi          = {10.1109/LATS49555.2020.9093684},
  timestamp    = {Thu, 14 Oct 2021 10:14:25 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MarquesMB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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