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BibTeX record conf/latw/KarelACGR18
@inproceedings{DBLP:conf/latw/KarelACGR18, author = {Amit Karel and Florence Aza{\"{\i}}s and Mariane Comte and Jean{-}Marc Galli{\`{e}}re and Michel Renovell}, title = {Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and {FDSOI} technologies}, booktitle = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo, Brazil, March 12-14, 2018}, pages = {1--5}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/LATW.2018.8349696}, doi = {10.1109/LATW.2018.8349696}, timestamp = {Fri, 19 Apr 2024 12:17:36 +0200}, biburl = {https://dblp.org/rec/conf/latw/KarelACGR18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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