BibTeX record conf/latw/IariaABRAGT22

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@inproceedings{DBLP:conf/latw/IariaABRAGT22,
  author       = {Giusy Iaria and
                  Francesco Angione and
                  Paolo Bernardi and
                  Matteo Sonza Reorda and
                  Davide Appello and
                  Giuseppe Garozzo and
                  Vincenzo Tancorre},
  title        = {A novel Pattern Selection Algorithm to reduce the Test Cost of large
                  Automotive Systems-on-Chip},
  booktitle    = {23rd {IEEE} Latin American Test Symposium, {LATS} 2022, Montevideo,
                  Uruguay, September 5-8, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/LATS57337.2022.9936975},
  doi          = {10.1109/LATS57337.2022.9936975},
  timestamp    = {Mon, 01 May 2023 13:01:30 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/IariaABRAGT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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