BibTeX record conf/latw/FiebackTHR18

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@inproceedings{DBLP:conf/latw/FiebackTHR18,
  author       = {Moritz Fieback and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Marco Rovatti},
  title        = {Ionizing radiation modeling in {DRAM} transistors},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349678},
  doi          = {10.1109/LATW.2018.8349678},
  timestamp    = {Sat, 05 Sep 2020 18:01:21 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/FiebackTHR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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