BibTeX record conf/latw/CopettiBBAP19

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@inproceedings{DBLP:conf/latw/CopettiBBAP19,
  author       = {Thiago Santos Copetti and
                  Tiago R. Balen and
                  E. Brum and
                  C. Aquistapace and
                  Leticia Bolzani Poehls},
  title        = {A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive
                  Defects},
  booktitle    = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile,
                  March 11-13, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/LATW.2019.8704579},
  doi          = {10.1109/LATW.2019.8704579},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiBBAP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}