BibTeX record conf/latw/ChampacVGVS22

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@inproceedings{DBLP:conf/latw/ChampacVGVS22,
  author       = {V{\'{\i}}ctor H. Champac and
                  Hector Villacorta and
                  Roberto G{\'{o}}mez{-}Fuentes and
                  Fabian Vargas and
                  Jaume Segura},
  title        = {Failure Probability due to Radiation-induced Effects in FinFET {SRAM}
                  Cells under Process Variations},
  booktitle    = {23rd {IEEE} Latin American Test Symposium, {LATS} 2022, Montevideo,
                  Uruguay, September 5-8, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/LATS57337.2022.9936923},
  doi          = {10.1109/LATS57337.2022.9936923},
  timestamp    = {Sun, 20 Nov 2022 22:42:09 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/ChampacVGVS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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