BibTeX record conf/latw/BernalJAC20

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@inproceedings{DBLP:conf/latw/BernalJAC20,
  author       = {Carlos Bernal and
                  Manuel Jim{\'{e}}nez and
                  Chris Aquino and
                  Raul Cedres},
  title        = {A Test Architecture and {VIE} to Characterize Dielectric Absorption
                  in Small Capacitors},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093687},
  doi          = {10.1109/LATS49555.2020.9093687},
  timestamp    = {Tue, 29 Nov 2022 17:32:48 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/BernalJAC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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