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BibTeX record conf/latw/BernalJAC20
@inproceedings{DBLP:conf/latw/BernalJAC20, author = {Carlos Bernal and Manuel Jim{\'{e}}nez and Chris Aquino and Raul Cedres}, title = {A Test Architecture and {VIE} to Characterize Dielectric Absorption in Small Capacitors}, booktitle = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil, March 30 - April 2, 2020}, pages = {1--5}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/LATS49555.2020.9093687}, doi = {10.1109/LATS49555.2020.9093687}, timestamp = {Tue, 29 Nov 2022 17:32:48 +0100}, biburl = {https://dblp.org/rec/conf/latw/BernalJAC20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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