BibTeX record conf/latw/BadawiABCKLG20

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@inproceedings{DBLP:conf/latw/BadawiABCKLG20,
  author       = {Hassan El Badawi and
                  Florence Aza{\"{\i}}s and
                  Serge Bernard and
                  Mariane Comte and
                  Vincent Kerz{\`{e}}rho and
                  Francois Lefevre and
                  I. Gorenflot},
  title        = {Implementing indirect test of {RF} circuits without compromising test
                  quality: a practical case study},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093666},
  doi          = {10.1109/LATS49555.2020.9093666},
  timestamp    = {Fri, 12 Jun 2020 14:45:45 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BadawiABCKLG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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