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BibTeX record conf/latw/BadawiABCKLG20
@inproceedings{DBLP:conf/latw/BadawiABCKLG20, author = {Hassan El Badawi and Florence Aza{\"{\i}}s and Serge Bernard and Mariane Comte and Vincent Kerz{\`{e}}rho and Francois Lefevre and I. Gorenflot}, title = {Implementing indirect test of {RF} circuits without compromising test quality: a practical case study}, booktitle = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil, March 30 - April 2, 2020}, pages = {1--6}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/LATS49555.2020.9093666}, doi = {10.1109/LATS49555.2020.9093666}, timestamp = {Fri, 12 Jun 2020 14:45:45 +0200}, biburl = {https://dblp.org/rec/conf/latw/BadawiABCKLG20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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