BibTeX record conf/lascas/BarekarM21

download as .bib file

@inproceedings{DBLP:conf/lascas/BarekarM21,
  author       = {Sheetal Barekar and
                  Madan Mali},
  title        = {On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection
                  Technique for Cache Memory},
  booktitle    = {12th {IEEE} Latin America Symposium on Circuits and System, {LASCAS}
                  2021, Arequipa, Peru, February 21-24, 2021},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/LASCAS51355.2021.9459175},
  doi          = {10.1109/LASCAS51355.2021.9459175},
  timestamp    = {Fri, 02 Jul 2021 16:33:13 +0200},
  biburl       = {https://dblp.org/rec/conf/lascas/BarekarM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.