BibTeX record conf/kdd/AbajoDLC04

• > Home > conf/kdd/AbajoDLC04

@inproceedings{DBLP:conf/kdd/AbajoDLC04,
  author       = {Nicol{\'{a}}s de Abajo and
                  Alberto B. Diez and
                  Vanesa Lobato and
                  Sergio R. Cuesta},
  editor       = {Won Kim and
                  Ron Kohavi and
                  Johannes Gehrke and
                  William DuMouchel},
  title        = {{ANN} quality diagnostic models for packaging manufacturing: an industrial
                  data mining case study},
  booktitle    = {Proceedings of the Tenth {ACM} {SIGKDD} International Conference on
                  Knowledge Discovery and Data Mining, Seattle, Washington, USA, August
                  22-25, 2004},
  pages        = {799--804},
  publisher    = {{ACM}},
  year         = {2004},
  url          = {https://doi.org/10.1145/1014052.1016917},
  doi          = {10.1145/1014052.1016917},
  timestamp    = {Tue, 06 Nov 2018 16:59:35 +0100},
  biburl       = {https://dblp.org/rec/conf/kdd/AbajoDLC04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}