BibTeX record conf/kbse/YoonY21

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@inproceedings{DBLP:conf/kbse/YoonY21,
  author       = {Juyeon Yoon and
                  Shin Yoo},
  title        = {Enhancing Lexical Representation of Test Coverage for Failure Clustering},
  booktitle    = {36th {IEEE/ACM} International Conference on Automated Software Engineering,
                  {ASE} 2021 - Workshops, Melbourne, Australia, November 15-19, 2021},
  pages        = {232--238},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ASEW52652.2021.00052},
  doi          = {10.1109/ASEW52652.2021.00052},
  timestamp    = {Mon, 31 Jan 2022 10:14:48 +0100},
  biburl       = {https://dblp.org/rec/conf/kbse/YoonY21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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