BibTeX record conf/kbse/LiuJ0DLFCCWB21

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@inproceedings{DBLP:conf/kbse/LiuJ0DLFCCWB21,
  author       = {Peiyu Liu and
                  Shouling Ji and
                  Xuhong Zhang and
                  Qinming Dai and
                  Kangjie Lu and
                  Lirong Fu and
                  Wenzhi Chen and
                  Peng Cheng and
                  Wenhai Wang and
                  Raheem Beyah},
  title        = {{IFIZZ:} Deep-State and Efficient Fault-Scenario Generation to Test
                  IoT Firmware},
  booktitle    = {36th {IEEE/ACM} International Conference on Automated Software Engineering,
                  {ASE} 2021, Melbourne, Australia, November 15-19, 2021},
  pages        = {805--816},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ASE51524.2021.9678785},
  doi          = {10.1109/ASE51524.2021.9678785},
  timestamp    = {Thu, 13 Apr 2023 17:53:31 +0200},
  biburl       = {https://dblp.org/rec/conf/kbse/LiuJ0DLFCCWB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}