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BibTeX record conf/itc/ZhangBA04
@inproceedings{DBLP:conf/itc/ZhangBA04, author = {Junwu Zhang and Michael L. Bushnell and Vishwani D. Agrawal}, title = {On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {617--626}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386999}, doi = {10.1109/TEST.2004.1386999}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZhangBA04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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