ZarrinehAEG00'

@inproceedings{DBLP:conf/itc/ZarrinehAEG00,
  author    = {Kamran Zarrineh and
               R. Dean Adams and
               Thomas J. Eckenrode and
               Steven P. Gregor},
  title     = {Self test architecture for testing complex memory structures},
  booktitle = {ITC},
  year      = {2000},
  pages     = {547-556},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894248},
  crossref  = {DBLP:conf/itc/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings IEEE International Test Conference 2000, Atlantic
               City, NJ, USA, October 2000},
  publisher = {IEEE Computer Society},
  year      = {2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}