BibTeX record conf/itc/YunNKSDBG20

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@inproceedings{DBLP:conf/itc/YunNKSDBG20,
  author       = {Jongsin Yun and
                  Benoit Nadeau{-}Dostie and
                  Martin Keim and
                  Lori Schramm and
                  Cyrille Dray and
                  El Mehdi Boujamaa and
                  Khushal Gelda},
  title        = {{MBIST} Supported Multi Step Trim for Reliable eMRAM Sensing},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325218},
  doi          = {10.1109/ITC44778.2020.9325218},
  timestamp    = {Mon, 25 Jan 2021 09:58:51 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YunNKSDBG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}