BibTeX record conf/itc/YunLYGGLNPSTYG22

• > Home > conf/itc/YunLYGGLNPSTYG22

@inproceedings{DBLP:conf/itc/YunLYGGLNPSTYG22,
  author       = {Feng Yun and
                  Yunkun Lin and
                  Lou Yunfei and
                  Lei Gao and
                  Vaibhav Gera and
                  Boxuan Li and
                  Vennela Chowdary Nekkanti and
                  Aditya Rajendra Pharande and
                  Kunal Sheth and
                  Meghana Thommondru and
                  Guizhong Ye and
                  Sandeep Gupta},
  title        = {Fault-coverage Maximizing March Tests for Memory Testing},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {529--533},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00066},
  doi          = {10.1109/ITC50671.2022.00066},
  timestamp    = {Thu, 21 Sep 2023 10:09:54 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/YunLYGGLNPSTYG22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}