BibTeX record conf/itc/YuWR00

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@inproceedings{DBLP:conf/itc/YuWR00,
  author       = {Xiaoming Yu and
                  Jue Wu and
                  Elizabeth M. Rudnick},
  title        = {Diagnostic test generation for sequential circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {225--234},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894210},
  doi          = {10.1109/TEST.2000.894210},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YuWR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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