BibTeX record conf/itc/YinCHL23

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@inproceedings{DBLP:conf/itc/YinCHL23,
  author       = {Yuxuan Yin and
                  Rebecca Chen and
                  Chen He and
                  Peng Li},
  title        = {Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction
                  Using On-Chip Monitor Data},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {99--104},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00024},
  doi          = {10.1109/ITC51656.2023.00024},
  timestamp    = {Sun, 06 Oct 2024 21:09:54 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/YinCHL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}