BibTeX record conf/itc/Ye0HCGLT0CLCEKLP13

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@inproceedings{DBLP:conf/itc/Ye0HCGLT0CLCEKLP13,
  author       = {Jing Ye and
                  Yu Huang and
                  Yu Hu and
                  Wu{-}Tung Cheng and
                  Ruifeng Guo and
                  Liyang Lai and
                  Ting{-}Pu Tai and
                  Xiaowei Li and
                  Wei{-}pin Changchien and
                  Daw{-}Ming Lee and
                  Ji{-}Jan Chen and
                  Sandeep C. Eruvathi and
                  Kartik K. Kumara and
                  Charles C. C. Liu and
                  Sam Pan},
  title        = {Diagnosis and Layout Aware {(DLA)} scan chain stitching},
  booktitle    = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
                  USA, September 6-13, 2013},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/TEST.2013.6651929},
  doi          = {10.1109/TEST.2013.6651929},
  timestamp    = {Sun, 04 Aug 2024 19:41:02 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Ye0HCGLT0CLCEKLP13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}