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BibTeX record conf/itc/YamadaFI92
@inproceedings{DBLP:conf/itc/YamadaFI92, author = {T. Yamada and Akihiro Fujiwara and Michiko Inoue}, title = {{COM} (Cost Oriented Memory) Testing}, booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992}, pages = {259}, publisher = {{IEEE} Computer Society}, year = {1992}, url = {https://doi.org/10.1109/TEST.1992.527831}, doi = {10.1109/TEST.1992.527831}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/YamadaFI92.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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