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BibTeX record conf/itc/Xing98
@inproceedings{DBLP:conf/itc/Xing98, author = {Y. Xing}, title = {Defect-oriented testing of mixed-signal ICs: some industrial experience}, booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington, DC, USA, October 18-22, 1998}, pages = {678--687}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/TEST.1998.743212}, doi = {10.1109/TEST.1998.743212}, timestamp = {Thu, 23 Mar 2023 23:58:37 +0100}, biburl = {https://dblp.org/rec/conf/itc/Xing98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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