@inproceedings{DBLP:conf/itc/XiaAK95,
author = {Jean Qincui Xia and
Tom Austin and
Nash Khouzam},
title = {Dynamic Test Emulation for EDA-Based Mixed-Signal Test Development
Automation},
booktitle = {ITC},
year = {1995},
pages = {761-770},
ee = {http://dx.doi.org/10.1109/TEST.1995.529907},
crossref = {DBLP:conf/itc/1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1995,
title = {Proceedings IEEE International Test Conference 1995, Driving
Down the Cost of Test, Washington, DC, USA, October 21-25,
1995},
publisher = {IEEE Computer Society},
year = {1995},
isbn = {0-7803-2992-9},
bibsource = {DBLP, http://dblp.uni-trier.de}
}