BibTeX record conf/itc/WuRTMKH21

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@inproceedings{DBLP:conf/itc/WuRTMKH21,
  author       = {Lizhou Wu and
                  Siddharth Rao and
                  Mottaqiallah Taouil and
                  Erik Jan Marinissen and
                  Gouri Sankar Kar and
                  Said Hamdioui},
  title        = {Testing {STT-MRAM:} Manufacturing Defects, Fault Models, and Test
                  Solutions},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {143--152},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00022},
  doi          = {10.1109/ITC50571.2021.00022},
  timestamp    = {Sat, 30 Sep 2023 09:50:58 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/WuRTMKH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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