DBLP Record 'conf/itc/WuA96'

BibTeX

@inproceedings{DBLP:conf/itc/WuA96,
  author    = {Yuejian Wu and
               Saman Adham},
  title     = {BIST Fault Diagnosis in Scan-Based VLSI Environments},
  booktitle = {ITC},
  year      = {1996},
  pages     = {48-57},
  crossref  = {DBLP:conf/itc/1996},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1996,
  title     = {Proceedings IEEE International Test Conference 1996, Test
               and Design Validity, Washington, DC, USA, October 20-25,
               1996},
  publisher = {IEEE Computer Society},
  year      = {1996},
  isbn      = {0-7803-3541-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}