DBLP Record 'conf/itc/WrightS03'

BibTeX

@inproceedings{DBLP:conf/itc/WrightS03,
  author    = {Derek Wright and
               Manoj Sachdev},
  title     = {Transistor-Level Fault Analysis and Test Algorithm Development
               for Ternary Dynamic Content Addressable Memorie},
  booktitle = {ITC},
  year      = {2003},
  pages     = {39-47},
  ee        = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630039abs.htm},
  crossref  = {DBLP:conf/itc/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference (ITC 2003),
               Breaking Test Interface Bottlenecks, 28 September - 3 October
               2003, Charlotte, NC, USA},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7803-8106-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}