BibTeX record conf/itc/Wilson94

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@inproceedings{DBLP:conf/itc/Wilson94,
  author       = {Walt Wilson},
  title        = {Faster, Better, Cheaper: What Does This Mean For The Test Industry?},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {13},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Wilson94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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