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BibTeX record conf/itc/WangSSNSW17
@inproceedings{DBLP:conf/itc/WangSSNSW17, author = {Li{-}C. Wang and Sebastian Siatkowski and Chuanhe Jay Shan and Matthew Nero and Nikolas Sumikawa and LeRoy Winemberg}, title = {Some considerations on choosing an outlier method for automotive product lines}, booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, pages = {1--10}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/TEST.2017.8242047}, doi = {10.1109/TEST.2017.8242047}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/WangSSNSW17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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