@inproceedings{DBLP:conf/itc/WangFFLWLLHL07,
author = {Da Wang and
Xiaoxin Fan and
Xiang Fu and
Hui Liu and
Ke Wen and
Rui Li and
Huawei Li and
Yu Hu and
Xiaowei Li},
title = {The design-for-testability features of a general purpose
microprocessor},
booktitle = {ITC},
year = {2007},
pages = {1-9},
ee = {http://dx.doi.org/10.1109/TEST.2007.4437585},
crossref = {DBLP:conf/itc/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2007,
editor = {Jill Sibert and
Janusz Rajski},
title = {2007 IEEE International Test Conference, ITC 2007, Santa
Clara, California, USA, October 21-26, 2007},
booktitle = {ITC},
publisher = {IEEE},
year = {2007},
isbn = {1-4244-1128-9},
ee = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
bibsource = {DBLP, http://dblp.uni-trier.de}
}