<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/VogelsZDBMBNFHGMRT04" mdate="2007-06-25">
<author>Thomas J. Vogels</author>
<author>Thomas Zanon</author>
<author>Rao Desineni</author>
<author>R. D. (Shawn) Blanton</author>
<author>Wojciech Maly</author>
<author>Jason G. Brown</author>
<author>Jeffrey E. Nelson</author>
<author>Y. Fei</author>
<author>X. Huang</author>
<author>Padmini Gopalakrishnan</author>
<author>Mahim Mishra</author>
<author>V. Rovner</author>
<author>S. Tiwary</author>
<title>Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.</title>
<pages>508-517</pages>
<year>2004</year>
<crossref>conf/itc/2004</crossref>
<booktitle>ITC</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/ITC.2004.43</ee>
<url>db/conf/itc/itc2004.html#VogelsZDBMBNFHGMRT04</url>
</inproceedings>
</dblp>
