BibTeX record conf/itc/VenkataramanPBA17

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@inproceedings{DBLP:conf/itc/VenkataramanPBA17,
  author       = {Srikanth Venkataraman and
                  Irith Pomeranz and
                  Shraddha Bodhe and
                  M. Enamul Amyeen},
  title        = {Test reordering for improved scan chain diagnosis using an enhanced
                  defect diagnosis procedure},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242049},
  doi          = {10.1109/TEST.2017.8242049},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/VenkataramanPBA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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