BibTeX record conf/itc/TsaiBC98

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@inproceedings{DBLP:conf/itc/TsaiBC98,
  author       = {Huan{-}Chih Tsai and
                  Sudipta Bhawmik and
                  Kwang{-}Ting Cheng},
  title        = {An almost full-scan {BIST} solution-higher fault coverage and shorter
                  test application time},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {1065--1073},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743305},
  doi          = {10.1109/TEST.1998.743305},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TsaiBC98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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