BibTeX record conf/itc/Tobey85

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@inproceedings{DBLP:conf/itc/Tobey85,
  author       = {John D. Tobey},
  title        = {Reducing Test Program Development Time for Memory Devices},
  booktitle    = {Proceedings International Test Conference 1985, Philadelphia, PA,
                  USA, November 1985},
  pages        = {949--953},
  publisher    = {{IEEE} Computer Society},
  year         = {1985},
  timestamp    = {Mon, 11 Nov 2002 15:59:32 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Tobey85.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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