BibTeX record conf/itc/ThaparTCAC23

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@inproceedings{DBLP:conf/itc/ThaparTCAC23,
  author       = {Dhruv Thapar and
                  Simon Thomann and
                  Arjun Chaudhuri and
                  Hussam Amrouch and
                  Krishnendu Chakrabarty},
  title        = {Analysis and Characterization of Defects in FeFETs},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {256--265},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00042},
  doi          = {10.1109/ITC51656.2023.00042},
  timestamp    = {Tue, 09 Jan 2024 17:09:36 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ThaparTCAC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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