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BibTeX record conf/itc/TeramotoF96
@inproceedings{DBLP:conf/itc/TeramotoF96, author = {Mitsuo Teramoto and Tomoo Fukazawa}, title = {Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan}, booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996}, pages = {21--28}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/TEST.1996.556939}, doi = {10.1109/TEST.1996.556939}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/TeramotoF96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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