BibTeX record: conf/itc/TangWVHWEPB04

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@inproceedings{DBLP:conf/itc/TangWVHWEPB04,
  author    = {Yuyi Tang and
               {Hans-Joachim} Wunderlich and
               Harald P. E. Vranken and
               Friedrich Hapke and
               Michael Wittke and
               Piet Engelke and
               Ilia Polian and
               Bernd Becker},
  title     = {X-Masking During Logic {BIST} and Its Impact on Defect Coverage.},
  booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  year      = {2004},
  pages     = {442--451},
  crossref  = {DBLP:conf/itc/2004},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.207},
  doi       = {10.1109/ITC.2004.207},
  timestamp = {Wed, 03 Sep 2014 05:03:26 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/TangWVHWEPB04},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2004,
  title     = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  year      = {2003},
  publisher = {{IEEE}},
  isbn      = {0-7803-8581-0},
  timestamp = {Wed, 03 Sep 2014 05:03:26 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/2004},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}