X-Masking During Logic BIST and Its Impact on Defect Coverage.

Yuyi Tang Hans-Joachim Wunderlich Harald P. E. Vranken Friedrich Hapke Michael Wittke Piet Engelke Ilia Polian Bernd Becker X-Masking During Logic BIST and Its Impact on Defect Coverage. 442-451 2004 conf/itc/2004 ITC http://doi.ieeecomputersociety.org/10.1109/ITC.2004.207 db/conf/itc/itc2004.html#TangWVHWEPB04