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BibTeX record conf/itc/SunterVM16
@inproceedings{DBLP:conf/itc/SunterVM16, author = {Stephen Sunter and Alessandro Valerio and Riccardo Miglierina}, title = {Automated measurement of defect tolerance in mixed-signal ICs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805869}, doi = {10.1109/TEST.2016.7805869}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/SunterVM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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