BibTeX record conf/itc/SuHWHKCW04

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@inproceedings{DBLP:conf/itc/SuHWHKCW04,
  author       = {Chin{-}Lung Su and
                  Rei{-}Fu Huang and
                  Cheng{-}Wen Wu and
                  Chien{-}Chung Hung and
                  Ming{-}Jer Kao and
                  Yeong{-}Jar Chang and
                  Wen Ching Wu},
  title        = {{MRAM} Defect Analysis and Fault Modeli},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {124--133},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386944},
  doi          = {10.1109/TEST.2004.1386944},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SuHWHKCW04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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