<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/StroudEBCN00" mdate="2002-11-20">
<author>Charles E. Stroud</author>
<author>John M. Emmert</author>
<author>John R. Bailey</author>
<author>Khushru S. Chhor</author>
<author>Dragan Nikolic</author>
<title>Bridging fault extraction from physical design data for manufacturing test development.</title>
<pages>760-769</pages>
<year>2000</year>
<crossref>conf/itc/2000</crossref>
<booktitle>ITC</booktitle>
<url>db/conf/itc/itc2000.html#StroudEBCN00</url>
</inproceedings>
</dblp>
