StoreyMAM91'

BibTeX

@inproceedings{DBLP:conf/itc/StoreyMAM91,
  author    = {Thomas M. Storey and
               Wojciech Maly and
               John Andrews and
               Myron Miske},
  title     = {Stuck Fault and Current Testing Comparison Using CMOS Chip
               Test},
  booktitle = {ITC},
  year      = {1991},
  pages     = {311-318},
  crossref  = {DBLP:conf/itc/1991},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1991,
  title     = {Proceedings IEEE International Test Conference 1991, Test:
               Faster, Better, Sooner, Nashville, TN, USA, October 26-30,
               1991},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1991},
  isbn      = {0-8186-9156-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}