Franco Stellari Peilin Song John Sylvestri D. Miles Orazio P. Forlenza Donato O. Forlenza On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). 1-10 2009 ITC http://dx.doi.org/10.1109/TEST.2009.5355543 conf/itc/2009 db/conf/itc/itc2009.html#StellariSSMFF09