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BibTeX record conf/itc/StancicFWTK02
@inproceedings{DBLP:conf/itc/StancicFWTK02, author = {M. Stancic and Liquan Fang and M. H. H. Weusthof and R. M. W. Tijink and Hans G. Kerkhoff}, title = {A New Test Generation Approach for Embedded Analogue Cores in SoC}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {861--869}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041840}, doi = {10.1109/TEST.2002.1041840}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/StancicFWTK02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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