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BibTeX record conf/itc/SrivastavaA22
@inproceedings{DBLP:conf/itc/SrivastavaA22, author = {Ankush Srivastava and Jais Abraham}, title = {Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {446--455}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00052}, doi = {10.1109/ITC50671.2022.00052}, timestamp = {Thu, 05 Jan 2023 13:25:50 +0100}, biburl = {https://dblp.org/rec/conf/itc/SrivastavaA22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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