BibTeX record conf/itc/SodenTTH89

download as .bib file

@inproceedings{DBLP:conf/itc/SodenTTH89,
  author       = {Jerry M. Soden and
                  R. Keith Treece and
                  Michael R. Taylor and
                  Charles F. Hawkins},
  title        = {{CMOS} {IC} Stuck-Open Fault Electrical Effects and Design Considerations},
  booktitle    = {Proceedings International Test Conference 1989, Washington, D.C.,
                  USA, August 1989},
  pages        = {423--430},
  publisher    = {{IEEE} Computer Society},
  year         = {1989},
  url          = {https://doi.org/10.1109/TEST.1989.82325},
  doi          = {10.1109/TEST.1989.82325},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SodenTTH89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.