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BibTeX record conf/itc/SinhaCER22
@inproceedings{DBLP:conf/itc/SinhaCER22, author = {Arani Sinha and Yonsang Cho and Jon Easter and Meizel V. Leiva Rojas}, title = {Multi-die Parallel Test Fabric for Scalability and Pattern Reusability}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {249--257}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00033}, doi = {10.1109/ITC50671.2022.00033}, timestamp = {Thu, 05 Jan 2023 13:25:50 +0100}, biburl = {https://dblp.org/rec/conf/itc/SinhaCER22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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