@inproceedings{DBLP:conf/itc/SinghRW95,
  author    = {Adit D. Singh and
               Haroon Rasheed and
               Walter W. Weber},
  title     = {I$_{\mbox{DDQ}}$ Testing of CMOS Opens: An Experimental Study},
  booktitle = {ITC},
  year      = {1995},
  pages     = {479-489},
  ee        = {http://dx.doi.org/10.1109/TEST.1995.529875},
  crossref  = {DBLP:conf/itc/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings IEEE International Test Conference 1995, Driving
               Down the Cost of Test, Washington, DC, USA, October 21-25,
               1995},
  publisher = {IEEE Computer Society},
  year      = {1995},
  isbn      = {0-7803-2992-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}