DBLP Record 'conf/itc/ShimonoOTKF85'

BibTeX

@inproceedings{DBLP:conf/itc/ShimonoOTKF85,
  author    = {T. Shimono and
               K. Oozeki and
               M. Takahashi and
               Masato Kawai and
               S. Funatsu},
  title     = {An AC/DC Test Generation System for Gate Array LSIs},
  booktitle = {ITC},
  year      = {1985},
  pages     = {329-333},
  crossref  = {DBLP:conf/itc/1985},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1985,
  title     = {Proceedings International Test Conference 1985, Philadelphia,
               PA, USA, November 1985},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1985},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}