BibTeX record conf/itc/ShimonoOTKF85

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@inproceedings{DBLP:conf/itc/ShimonoOTKF85,
  author       = {T. Shimono and
                  K. Oozeki and
                  M. Takahashi and
                  Masato Kawai and
                  Shigehiro Funatsu},
  title        = {An {AC/DC} Test Generation System for Gate Array LSIs},
  booktitle    = {Proceedings International Test Conference 1985, Philadelphia, PA,
                  USA, November 1985},
  pages        = {329--333},
  publisher    = {{IEEE} Computer Society},
  year         = {1985},
  timestamp    = {Thu, 23 Feb 2012 17:18:14 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShimonoOTKF85.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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