Manish Sharma Wu-Tung Cheng Ting-Pu Tai Y. S. Cheng Will Hsu Chen Liu Sudhakar M. Reddy Albert Mann Faster defect localization in nanometer technology based on defective cell diagnosis. 1-10 2007 ITC http://dx.doi.org/10.1109/TEST.2007.4437604 conf/itc/2007 db/conf/itc/itc2007.html#SharmaCTCHLRM07